JPH0222873Y2 - - Google Patents

Info

Publication number
JPH0222873Y2
JPH0222873Y2 JP1981016865U JP1686581U JPH0222873Y2 JP H0222873 Y2 JPH0222873 Y2 JP H0222873Y2 JP 1981016865 U JP1981016865 U JP 1981016865U JP 1686581 U JP1686581 U JP 1686581U JP H0222873 Y2 JPH0222873 Y2 JP H0222873Y2
Authority
JP
Japan
Prior art keywords
wall thickness
bottom plate
plate
outer circumferential
circumferential rib
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1981016865U
Other languages
English (en)
Japanese (ja)
Other versions
JPS57129286U (en]
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1981016865U priority Critical patent/JPH0222873Y2/ja
Priority to US06/323,024 priority patent/US4438860A/en
Publication of JPS57129286U publication Critical patent/JPS57129286U/ja
Application granted granted Critical
Publication of JPH0222873Y2 publication Critical patent/JPH0222873Y2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B23/00—Record carriers not specific to the method of recording or reproducing; Accessories, e.g. containers, specially adapted for co-operation with the recording or reproducing apparatus ; Intermediate mediums; Apparatus or processes specially adapted for their manufacture
    • G11B23/02—Containers; Storing means both adapted to cooperate with the recording or reproducing means
    • G11B23/04—Magazines; Cassettes for webs or filaments
    • G11B23/08—Magazines; Cassettes for webs or filaments for housing webs or filaments having two distinct ends
    • G11B23/087—Magazines; Cassettes for webs or filaments for housing webs or filaments having two distinct ends using two different reels or cores
    • G11B23/08707—Details
    • G11B23/08785—Envelopes
JP1981016865U 1981-02-09 1981-02-09 Expired JPH0222873Y2 (en])

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP1981016865U JPH0222873Y2 (en]) 1981-02-09 1981-02-09
US06/323,024 US4438860A (en) 1981-02-09 1981-11-19 Magnetic tape cassette

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1981016865U JPH0222873Y2 (en]) 1981-02-09 1981-02-09

Publications (2)

Publication Number Publication Date
JPS57129286U JPS57129286U (en]) 1982-08-12
JPH0222873Y2 true JPH0222873Y2 (en]) 1990-06-20

Family

ID=11928104

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1981016865U Expired JPH0222873Y2 (en]) 1981-02-09 1981-02-09

Country Status (2)

Country Link
US (1) US4438860A (en])
JP (1) JPH0222873Y2 (en])

Cited By (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7138810B2 (en) 2002-11-08 2006-11-21 Cascade Microtech, Inc. Probe station with low noise characteristics
US7138813B2 (en) 1999-06-30 2006-11-21 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US7164279B2 (en) 1995-04-14 2007-01-16 Cascade Microtech, Inc. System for evaluating probing networks
US7176705B2 (en) 2004-06-07 2007-02-13 Cascade Microtech, Inc. Thermal optical chuck
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
US7190181B2 (en) 1997-06-06 2007-03-13 Cascade Microtech, Inc. Probe station having multiple enclosures
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7221146B2 (en) 2002-12-13 2007-05-22 Cascade Microtech, Inc. Guarded tub enclosure
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US7268533B2 (en) 2001-08-31 2007-09-11 Cascade Microtech, Inc. Optical testing device
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
US7330023B2 (en) 1992-06-11 2008-02-12 Cascade Microtech, Inc. Wafer probe station having a skirting component
US7348787B2 (en) 1992-06-11 2008-03-25 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US7352168B2 (en) 2000-09-05 2008-04-01 Cascade Microtech, Inc. Chuck for holding a device under test
US7368925B2 (en) 2002-01-25 2008-05-06 Cascade Microtech, Inc. Probe station with two platens
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7554322B2 (en) 2000-09-05 2009-06-30 Cascade Microtech, Inc. Probe station

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD277568S (en) 1982-05-20 1985-02-12 Victor Company Of Japan, Limited Video tape cassette lower half casing
USD277567S (en) 1982-05-20 1985-02-12 Victor Company Of Japan, Limited Video tape cassette upper half casing
JPH059343Y2 (en]) * 1984-11-08 1993-03-08
JPH0419647Y2 (en]) * 1985-08-08 1992-05-06
DE9211031U1 (de) * 1991-09-06 1993-01-28 Minnesota Mining & Mfg. Co., Saint Paul, Minn. Einspulige Kassette ohne Schrumpfvertiefung am Gehäuse und Gehäusehälfte für eine solche Kassette
JP2541340Y2 (ja) * 1991-11-13 1997-07-16 富士写真フイルム株式会社 磁気テープカセット
JP3492477B2 (ja) * 1996-08-27 2004-02-03 Ｔｄｋ株式会社 テープカセット
JP2004213741A (ja) * 2002-12-27 2004-07-29 Fuji Photo Film Co Ltd 記録テープカートリッジ

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH398441A (de) * 1960-09-24 1966-03-15 Mauser Kg Stapelbarer Kasten aus Kunststoff
JPS579988Y2 (en]) * 1976-09-03 1982-02-25
JPS5511637U (en]) * 1978-07-04 1980-01-25
JPS624948Y2 (en]) * 1979-04-24 1987-02-04

Cited By (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7589518B2 (en) 1992-06-11 2009-09-15 Cascade Microtech, Inc. Wafer probe station having a skirting component
US7348787B2 (en) 1992-06-11 2008-03-25 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US7330023B2 (en) 1992-06-11 2008-02-12 Cascade Microtech, Inc. Wafer probe station having a skirting component
US7492147B2 (en) 1992-06-11 2009-02-17 Cascade Microtech, Inc. Wafer probe station having a skirting component
US7595632B2 (en) 1992-06-11 2009-09-29 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US7164279B2 (en) 1995-04-14 2007-01-16 Cascade Microtech, Inc. System for evaluating probing networks
US7321233B2 (en) 1995-04-14 2008-01-22 Cascade Microtech, Inc. System for evaluating probing networks
US7190181B2 (en) 1997-06-06 2007-03-13 Cascade Microtech, Inc. Probe station having multiple enclosures
US7436170B2 (en) 1997-06-06 2008-10-14 Cascade Microtech, Inc. Probe station having multiple enclosures
US7626379B2 (en) 1997-06-06 2009-12-01 Cascade Microtech, Inc. Probe station having multiple enclosures
US7292057B2 (en) 1999-06-30 2007-11-06 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US7138813B2 (en) 1999-06-30 2006-11-21 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US7616017B2 (en) 1999-06-30 2009-11-10 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US7518358B2 (en) 2000-09-05 2009-04-14 Cascade Microtech, Inc. Chuck for holding a device under test
US7501810B2 (en) 2000-09-05 2009-03-10 Cascade Microtech, Inc. Chuck for holding a device under test
US7514915B2 (en) 2000-09-05 2009-04-07 Cascade Microtech, Inc. Chuck for holding a device under test
US7554322B2 (en) 2000-09-05 2009-06-30 Cascade Microtech, Inc. Probe station
US7352168B2 (en) 2000-09-05 2008-04-01 Cascade Microtech, Inc. Chuck for holding a device under test
US7423419B2 (en) 2000-09-05 2008-09-09 Cascade Microtech, Inc. Chuck for holding a device under test
US7268533B2 (en) 2001-08-31 2007-09-11 Cascade Microtech, Inc. Optical testing device
US7368925B2 (en) 2002-01-25 2008-05-06 Cascade Microtech, Inc. Probe station with two platens
US7295025B2 (en) 2002-11-08 2007-11-13 Cascade Microtech, Inc. Probe station with low noise characteristics
US7138810B2 (en) 2002-11-08 2006-11-21 Cascade Microtech, Inc. Probe station with low noise characteristics
US7550984B2 (en) 2002-11-08 2009-06-23 Cascade Microtech, Inc. Probe station with low noise characteristics
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US7498828B2 (en) 2002-11-25 2009-03-03 Cascade Microtech, Inc. Probe station with low inductance path
US7221146B2 (en) 2002-12-13 2007-05-22 Cascade Microtech, Inc. Guarded tub enclosure
US7639003B2 (en) 2002-12-13 2009-12-29 Cascade Microtech, Inc. Guarded tub enclosure
US7468609B2 (en) 2003-05-06 2008-12-23 Cascade Microtech, Inc. Switched suspended conductor and connection
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7876115B2 (en) 2003-05-23 2011-01-25 Cascade Microtech, Inc. Chuck for holding a device under test
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US7362115B2 (en) 2003-12-24 2008-04-22 Cascade Microtech, Inc. Chuck with integrated wafer support
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
US7504823B2 (en) 2004-06-07 2009-03-17 Cascade Microtech, Inc. Thermal optical chuck
US7176705B2 (en) 2004-06-07 2007-02-13 Cascade Microtech, Inc. Thermal optical chuck
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors

Also Published As

Publication number Publication date
JPS57129286U (en]) 1982-08-12
US4438860A (en) 1984-03-27

Similar Documents

Publication Publication Date Title
JPH0222873Y2 (en])
JP2541340Y2 (ja) 磁気テープカセット
US4706149A (en) Tape cassette
GB2040264A (en) Tape reel for video cassette
JPH0629832Y2 (ja) 磁気テ−プカセット
JP3033685B2 (ja) テープカセットにおけるテープリール
JPS5850540Y2 (ja) 磁気テ−プカセット
JPH0419647Y2 (en])
JP2906746B2 (ja) カセットハーフ
JP2547477Y2 (ja) 磁気テープカセット
JPH0516134Y2 (en])
JP4244681B2 (ja) カセット収納ケース
JPH0441500Y2 (en])
JP2593537Y2 (ja) テープカセット
JPS6215907Y2 (en])
JP2598976Y2 (ja) ディスクカートリッジ
JPH0419648Y2 (en])
JPH0624064Y2 (ja) テープカセット
JP2592901Y2 (ja) ディスクカートリッジ
JP2534021Y2 (ja) テープカセット収納ケース
JP2570520Y2 (ja) 磁気テープカセット
JP3424365B2 (ja) テープカセット
JPS6327339Y2 (en])
JPH0441508Y2 (en])
JP2599608Y2 (ja) テープカセット